勵威電子股份有限公司（ProbeLeader Co., Ltd）携PL-Mi6C 被動元件外觀檢查機将于2015年5月26-28日深圳国际电源工业及电子变压器展亮相，展位号：A103。

一、公司简介：

    勵威電子以製造半導體及LCD面板測試用配件，包括探針卡及 Logic & DRAM IC測試插座為主。勵威電子成立於2002年11月，現在擁有新竹香山及大陸無錫兩處生産基地，同時在高雄設有維修中心。

    Established in 2002, ProbeLeader (PL) has been an expert in designing and manufacturing of testing solutions for semiconductor and LCD panel industries. Our products include probe cards, Load-Boards, IC sockets for logic & DRAM ICs…etc. PL owns our production sites in both Hsin-Chu, Taiwan and WuXi, China, as well as a repair center in Kaohsiung.

    勵威致力於提供半導體及LCD面板產業之測試方案，此外亦已跨足光電產業及被動元件測試產業等。除了客製化的測試介面設計與生產外，服務內容亦包含機台代理銷售、機台搬遷、機台零件更換維修及相關 after service 等。10年以上的專業被動元件外觀檢查設備經驗，提供您最先進的元件檢查技術。

    Other than providing testing solutions for semiconductor and LCD panel industries, PL has also extended our business to testing solutions for optoelectronics and passive components. Not only design, manufacture customized testing tools but also deal with sales, relocation, refurbishment and after-services of used-equipments. Professional MicroChip Inspection team, We provide advanced Inspection technology for Passive Component Defect Inspection.

    擁有充足產能、穩定品質、高度彈性配合以及多元化服務是勵威的優勢。我們期待與客戶一同成長並建立長期互信與雙贏之夥伴關係。

    Bountifulproduction-capacity, stable quality and wide range of services with highflexibility are our strength. We look forward to building a long-term, mutualtrusting and win-win relationship with our customers.

二、产品介绍：

    PL-Mi6C 被動元件外觀檢查機PL-Mi6C Micro Chip Inspection System

    被動元件外觀檢查機可以檢驗被動元件外觀，如MLCC、MLCI、Chip-R、Network、 Array、Inductors、EMI-Filter、Coil、Ferrite Core…etc，也可以用於其他相關電子產品以及半導體產業中前、後段IC的外觀檢測。

    The function of Micro Chip Inspection System is to inspect micro multi-layer ceramic chips, such as MLCC and used in the electronic products, front & backend 2D & 3D appearance inspection system for the semiconductor industry.